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Feasibility and utility of intraoperative epicardial scar characterization during left ventricular assist device implantation.

Moss JD, Oesterle A, Raiman M, Flatley EE, Beaser AD, Jeevanandam V, Klein L, Ota T, Wieselthaler G, Uriel N, Tung R. Feasibility and utility of intraoperative epicardial scar characterization during left ventricular assist device implantation. J Cardiovasc Electrophysiol. 2019 02; 30(2):183-192.

View in: PubMed