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A cortical potential imaging study from simultaneous extra- and intracranial electrical recordings by means of the finite element method.

Zhang Y, Ding L, van Drongelen W, Hecox K, Frim DM, He B. A cortical potential imaging study from simultaneous extra- and intracranial electrical recordings by means of the finite element method. Neuroimage. 2006 Jul 15; 31(4):1513-24.

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