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Connection

Raymond Hulse to Crystallography, X-Ray

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This is a "connection" page, showing publications Raymond Hulse has written about Crystallography, X-Ray.
Raymond Hulse
Connection Strength
0.027
Crystallography, X-Ray
  1. Structural mechanism of voltage-dependent gating in an isolated voltage-sensing domain. Nat Struct Mol Biol. 2014 Mar; 21(3):244-52.
    View in: PubMed
    Score: 0.027
Connection Strength

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Publication scores are based on many factors, including how long ago they were written and whether the person is a first or senior author.